Augmented reality system for stitching along a predetermined path

ABSTRACT

Disclosed are various systems and features for use with a machine, such as a sewing machine, to facilitate augmented-reality features such as projecting assistive visual elements or virtual UI elements into an operational area. Such systems and features may be useful in the context of performing an action along a self-guided path on a substrate.

RELATED APPLICATIONS

This application is a continuation of U.S. application Ser. No.16/004,323 filed Jun. 8, 2018, which issues Jan. 12, 2021 as U.S. Pat.No. 10,889,925, which is incorporated herein by reference.

Under provisions of 35 U.S.C. § 120, U.S. application Ser. No.16/004,323 filed Jun. 8, 2018 is a Continuation-In-Part of U.S.application Ser. No. 15/618,047 filed Jun. 8, 2017 (the “NP1disclosure”), which issued Feb. 18, 2020 as U.S. Pat. No. 10,563,330,which claims benefit of U.S. Provisional Application No. 62/347,306filed Jun. 8, 2016 (the “PV1 disclosure”), claims benefit of U.S.Provisional Application No. 62/517,078 filed Jun. 8, 2017 (the “PV2disclosure”), claims benefit of U.S. Provisional Application No.62/517,080 filed Jun. 8, 2017 (the “PV3 disclosure”), claims benefit ofU.S. Provisional Application No. 62/517,084 filed Jun. 8, 2017 (the “PV4disclosure”), claims benefit of U.S. Provisional Application No.62/517,087 filed Jun. 8, 2017 (the “PV5 disclosure”), claims benefit ofU.S. Provisional Application No. 62/517,091 filed Jun. 8, 2017 (the “PV6disclosure”), and claims benefit of U.S. Provisional Application No.62/517,092 filed Jun. 8, 2017 (the “PV7 disclosure”), which areincorporated herein by reference.

Under provisions of 35 U.S.C. § 120, U.S. application Ser. No.16/004,323 filed Jun. 8, 2018 claims benefit of U.S. ProvisionalApplication No. 62/347,306 filed Jun. 8, 2016 (the “PV1 disclosure”),claims benefit of U.S. Provisional Application No. 62/517,078 filed Jun.8, 2017 (the “PV2 disclosure”), claims benefit of U.S. ProvisionalApplication No. 62/517,080 filed Jun. 8, 2017 (the “PV3 disclosure”),claims benefit of U.S. Provisional Application No. 62/517,084 filed Jun.8, 2017 (the “PV4 disclosure”), claims benefit of U.S. ProvisionalApplication No. 62/517,087 filed Jun. 8, 2017 (the “PV5 disclosure”),claims benefit of U.S. Provisional Application No. 62/517,091 filed Jun.8, 2017 (the “PV6 disclosure”), and claims benefit of U.S. ProvisionalApplication No. 62/517,092 filed Jun. 8, 2017 (the “PV7 disclosure”),which are incorporated herein by reference.

Furthermore, U.S. application Ser. No. 16/004,323 filed Jun. 8, 2018(the “NP2 disclosure”), which issues on Jan. 12, 2021 as U.S. Pat. No.10,889,925, is related to the following applications, assigned to theassignee of the present application, and hereby incorporated byreference: U.S. application Ser. No. 16/004,325 filed Jun. 8, 2018 (the“NP3 disclosure”), issued Jan. 12, 2021 as U.S. Pat. No. 10,889,926,U.S. application Ser. No. 16/004,326 filed Jun. 8, 2018 (the “NP4disclosure”), U.S. application Ser. No. 16/004,329 filed Jun. 8, 2018(the “NP5 disclosure”), issued Jan. 5, 2021 as U.S. Pat. No. 10,883,210,U.S. application Ser. No. 16/004,330 filed Jun. 8, 2018 (the “NP6disclosure”), issued Jan. 12, 2021 as U.S. Pat. No. 10,889,927, and U.S.application Ser. No. 16/004,332 filed Jun. 8, 2018 (the “NP7disclosure”).

It is intended that each of the referenced applications may beapplicable to the concepts and embodiments disclosed herein, even ifsuch concepts and embodiments are disclosed in the referencedapplications with different limitations and configurations and describedusing different examples and terminology.

FIELD OF DISCLOSURE

The present disclosure relates to a method and system for stitchingalong a predetermined path along a material. More specifically, variousembodiments of the present disclosure relate to augmented reality andprojection systems used in a sewing environment.

BACKGROUND

There is often a need to guide an item on a predetermined path along asubstrate for various applications; for example, cutting, gluing,welding, riveting, marking, paint, inspecting, sewing and 3D printing.

Guiding an item, such as a needle, on a desired path along a substrateis particularly significant for materials such as textiles. Knownsystems and methods suffer from several shortcomings. For example, theyrequire a lot of manual intervention. Further, they may require that thepath to be followed actually be on the substrate. In addition, the knownsystems and methods may be limited to certain styles, patterns and depthof substrates. In addition, they do not provide real-time,self-correction for correcting the position of the item when it gets offthe desired path along a substrate.

Therefore, there is a need to improve systems and methods for guiding anitem on a desired path along a substrate, such as a sheet of textilematerial.

BRIEF OVERVIEW

This brief overview is provided to introduce a selection of concepts ina simplified form that are further described below in the DetailedDescription. This brief overview is not intended to identify keyfeatures or essential features of the claimed subject matter. Nor isthis brief overview intended to be used to limit the claimed subjectmatter's scope.

One objective of the disclosed guiding apparatus may be to facilitateidentifying an object and it's positioning on a substrate, and thenperforming an action along a self-guided path in association with thatobject on the substrate.

Additionally, another objective of the guiding apparatus may be tocalibrate various components to correctly identify an object and it'spositioning on a substrate, and then perform an action along aself-guided path in association with that object on the substrate.

Further, another objective of the guiding apparatus may be to providedata to a sewing machine's controller to operate the sewing machine tostitch along a path associated with the object (e.g., the outline of theobject).

Additionally, another objective of the guiding apparatus may be todetermine in real time a path to perform certain actions such asstitching, sewing, tacking, cutting, adhesing, bonding, welding,riveting, embossing, marking, painting, dying, etching, masking,measuring, inspecting, cutting, abrading, scoring, 3D printing, orexposing to liquids, gasses, catalysts, agents, or electromagneticwaves.

Further, another objective of the guiding apparatus may be to utilizeone or more of lighting units, optical sensors, controllers, and userinterface components to perform an action along a self-guided path inassociation with an object on the substrate.

Additionally, another objective of the guiding apparatus is to beremovably attachable to a machine, such as a sewing machine.Accordingly, in order to fulfill one or more objectives, the guidingapparatus may include a support member configured to be mounted on themachine. For instance, as illustrated in FIGS. 1A-B, the support membermay be configured to be mounted on a face of the machine's body.

Additionally, the support member may support one or more of lightingunits, optical sensors, controllers, and user interface components.

Further, another objective of the guiding apparatus may be to functionin one or more of the multiple available modes include a calibrationmode, an inspection mode a teaching mode and an operation mode.

Further objective of the guiding apparatus may be to operate incalibration mode including testing illumination or sensor, calibrationstitching on a test fabric, comparing the calibration stitching withactual stitching, and making calculations for needle alignment.

Further objective of the guiding apparatus may be operating ininspection mode wherein an operator calibrates a machine, based onactually stitching a test badge to the test fabric. Note that the terms“badge” and “patch” are used interchangeably to refer in a non-limitingsense to fabric and non-fabric items that may be sewed onto, affixed to,or otherwise combined with a material.

Further objective of the guiding apparatus may be to operate in teachingmode to make sure that the sensors of the apparatus can distinguish abackground fabric against the material of the badge to be stitched on tothe fabric.

Further objective of the guiding apparatus may be to function inoperation mode wherein the sensors detect a patch overlaid on thefabric, and they control the sewing machine to automatically sew thepatch onto the fabric.

Further, another objective of the guiding apparatus is to integrate witha sewing machine to auto-detect materials to be stitched. Once detected,the guiding apparatus determines, in real-time, a sewing path, sewingstitch integrity, and stitch count. The guiding apparatus furthervalidates the specification for the aforementioned in real-time. Forexample, it can detect a badge on a fabric and stitch the badge to thefabric. Other materials can include carbon fibers, composite threads,human or animal tissue, and conductive thread.

Embodiments of the present disclosure provide a system comprising, butnot limited to, lighting and optical sensors, a controller, and a UIdisplay module. The system may connect to, for example, but not belimited to, a sewing machine with a controller. Although sewing machinesare used as some embodiments for descriptive purposes, the integrationof the light and optical sensors may be with other controller operateddevices, not just sewing machines. For examples, an optical sensorsystem may be used with laser, IR, 3-D vision, stereoscopic, gyroscopic,Ultrasonic, and other devices.

A general principle of the present disclosure involves the use of thelighting and optical sensor system to identify objects, theirplacement/positioning on a substrate, and to perform an action along aself-guided path in association with that object on the substrate. Oneexample is the stitching of an identified object onto the substrate. Inthis example, the optical system may provide data to a sewing machine'scontroller to operate the sewing machine. In turn, the machine may beenabled to stitch along a path associated with the object (e.g., theoutline of the object). Accordingly, embodiments of the presentdisclosure may be enabled to determine in real time a path to performcertain actions such as cutting, welding, riveting, gluing, 3D printing,etc.

Referring back to the example of sewing, embodiments of the presentdisclosure integrate with a sewing machine so as to be able toauto-detect materials to be stitched. Once detected, the system may beused to determine, in real-time, a sewing path, sewing stitch integrity,and stitch count. The system may further validate the specification forthe aforementioned in real-time. As one example, it can detect a badgeon a fabric and stitch the badge to the fabric. Other materials caninclude carbon fibers, composite threads, human or animal tissue,conductive thread, and the like.

Various embodiments of the present disclosure may operate in, but not belimited to, the following modes: 1) calibration, 2) inspection, 3)teaching, and 4) operation.

During calibration mode, the system may ensure that the optical sensorsare properly aligned with the sewing needle for control. As will bedetailed below, the stages involved in calibration include: 1)illumination/sensor testing, 2) calibration stitching on a test fabric(e.g., a white sheet), and 3) comparing the calibration stitching withactual stitching, and 4) making calculations for needle alignment. Inthis way, an operator may determine that the sewing machine's needle isproperly calibrated to its sensors.

During the inspection mode, a test badge may be stitched to a testfabric. In turn, the operator may again be enabled to calibrate themachine, but this time. The operator can then determine if the machinewas calibrated properly by seeing how the test badge was stitched to thefabric.

An objective of the teaching mode may be to ensure that the sensors areenabled to distinguish the background fabric (e.g., acolor/texture/pattern) with the material of the badge to be stitched onto the fabric. In other words, a teaching mode may be used to ensurethat the optical sensors and illumination components are properlyoptimized for the fabric type. Once the system determines the fabrictype, it can better detect the badge overlaid on the fabric and moreaccurately stitch the badge to the fabric. The teaching stage may beperformed once for each batch of fabrics, and may not need to beperformed each time.

Once the system is configured, the system may enter an operation mode.The operation mode may employ the system sensors to detect a badgeoverlaid on the fabric and control the sewing machine to automaticallysew the badge onto the fabric.

It should be understood that actions performed by an operator may bereplaced with a processing module embodied in the systems of the presentdisclosure.

Both the foregoing brief overview and the following detailed descriptionprovide examples and are explanatory only. Accordingly, the foregoingbrief overview and the following detailed description should not beconsidered to be restrictive. Further, features or variations may beprovided in addition to those set forth herein. For example, embodimentsmay be directed to various feature combinations and sub-combinationsdescribed in the detailed description.

BRIEF DESCRIPTION OF THE DRAWINGS

The accompanying drawings, which are incorporated in and constitute apart of this disclosure, illustrate various embodiments of the presentdisclosure. The drawings contain representations of various trademarksand copyrights owned by the Applicants. In addition, the drawings maycontain other marks owned by third parties and are being used forillustrative purposes only. All rights to various trademarks andcopyrights represented herein, except those belonging to theirrespective owners, are vested in and the property of the Applicants. TheApplicants retain and reserve all rights in their trademarks andcopyrights included herein, and grant permission to reproduce thematerial only in connection with reproduction of the granted patent andfor no other purpose.

Furthermore, the drawings and their brief descriptions below may containtext or captions that may explain certain embodiments of the presentdisclosure. This text is included for illustrative, non-limiting,explanatory purposes of certain embodiments detailed in the presentdisclosure. In the drawings:

FIG. 1A illustrates a sectional views of a guiding apparatus inaccordance with various embodiments of the present disclosure.

FIG. 1B illustrates a perspective view of a support member of a guidingapparatus in accordance with various embodiments of the presentdisclosure.

FIG. 2 illustrates a perspective view of a guiding apparatus with acover and a test fabric placed within the stitching area of a sewingmachine in accordance with various embodiments of the presentdisclosure.

FIG. 3 illustrates a perspective view of a guiding apparatus attached toa machine in accordance with various embodiments of the presentdisclosure.

FIG. 4 is a block diagram of a computing unit of a guiding apparatus inaccordance with various embodiments of the present disclosure.

FIG. 5 illustrates an operating environment through which a guidingplatform consistent with various embodiments of the present disclosuremay be provided.

FIG. 6 is a flowchart related to a calibration method consistent withvarious embodiments of the present disclosure.

FIG. 7 is a flowchart related to an illumination calibration methodconsistent with various embodiments of the present disclosure.

FIG. 8 is a flowchart related to a vision calibration method consistentwith various embodiments of the present disclosure.

FIG. 9 is a flowchart related to a patch sewing method consistent withvarious embodiments of the present disclosure.

FIG. 10 is a flowchart related to another patch sewing method consistentwith various embodiments of the present disclosure.

FIG. 11 is a flowchart related to a background training methodconsistent with various embodiments of the present disclosure.

FIG. 12 is a flowchart related to a patch finding method consistent withvarious embodiments of the present disclosure.

FIG. 13 is a flowchart related to a sewing verification methodconsistent with various embodiments of the present disclosure.

FIG. 14 is a flowchart related to a garment loading method consistentwith various embodiments of the present disclosure.

FIG. 15 is a flowchart related to a stitch path generation methodconsistent with various embodiments of the present disclosure.

FIG. 16 is a flowchart related to a patch tacking method consistent withvarious embodiments of the present disclosure.

FIG. 17 is a flowchart related to another calibration method consistentwith various embodiments of the present disclosure.

FIG. 18 is a flowchart related to a projection system calibration methodconsistent with various embodiments of the present disclosure.

FIG. 19 is a flowchart related to yet another patch sewing methodconsistent with various embodiments of the present disclosure.

FIG. 20 is a flowchart related to a guided garment loading methodconsistent with various embodiments of the present disclosure.

FIG. 21 is a flowchart related to another background training methodconsistent with various embodiments of the present disclosure.

FIG. 22 is a flowchart related to a guided patch placement methodconsistent with various embodiments of the present disclosure.

FIG. 23 is a flowchart related to a library training method consistentwith various embodiments of the present disclosure.

FIG. 24 is a flowchart related to still another patch sewing methodconsistent with various embodiments of the present disclosure.

FIGS. 25A-B illustrates top plan views of exemplary patches with which aguiding apparatus consistent with the present disclosure may interact.

FIG. 26 is a flowchart related to an obstruction detection methodconsistent with various embodiments of the present disclosure.

FIG. 27 is a flowchart related to a gesture detection method consistentwith various embodiments of the present disclosure.

FIG. 28 illustrates a perspective view of a guiding apparatus having a3-dimensional vision system in accordance with various embodiments ofthe present disclosure.

FIG. 29 is a flowchart related to yet another background training methodin accordance with various embodiments of the present disclosure.

FIGS. 30A-B is a flowchart related to again another patch sewing methodin accordance with various embodiments of the present disclosure.

FIG. 31 is a flowchart related to a patch verification method inaccordance with various embodiments of the present disclosure.

FIG. 32 is a platform for performing an action along a self-guided pathin association with an object on a substrate in accordance with variousembodiments of the present disclosure.

DETAILED DESCRIPTION

As a preliminary matter, it will readily be understood by one havingordinary skill in the relevant art that the present disclosure has broadutility and application. As should be understood, any embodiment mayincorporate only one or a plurality of the above-disclosed aspects ofthe disclosure and may further incorporate only one or a plurality ofthe above-disclosed features. Furthermore, any embodiment discussed andidentified as being “preferred” is considered to be part of a best modecontemplated for carrying out the embodiments of the present disclosure.Other embodiments also may be discussed for additional illustrativepurposes in providing a full and enabling disclosure. Moreover, manyembodiments, such as adaptations, variations, modifications, andequivalent arrangements, will be implicitly disclosed by the embodimentsdescribed herein and fall within the scope of the present disclosure.

Accordingly, while embodiments are described herein in detail inrelation to one or more embodiments, it is to be understood that thisdisclosure is illustrative and exemplary of the present disclosure, andare made merely for the purposes of providing a full and enablingdisclosure. The detailed disclosure herein of one or more embodiments isnot intended, nor is to be construed, to limit the scope of patentprotection afforded in any claim of a patent issuing here from, whichscope is to be defined by the claims and the equivalents thereof. It isnot intended that the scope of patent protection be defined by readinginto any claim a limitation found herein that does not explicitly appearin the claim itself.

Thus, for example, any sequence(s) and/or temporal order of stages ofvarious processes or methods that are described herein are illustrativeand not restrictive. Accordingly, it should be understood that, althoughstages of various processes or methods may be shown and described asbeing in a sequence or temporal order, the stages of any such processesor methods are not limited to being carried out in any particularsequence or order, absent an indication otherwise. Indeed, the stages insuch processes or methods generally may be carried out in variousdifferent sequences and orders while still falling within the scope ofthe present disclosure. Accordingly, it is intended that the scope ofpatent protection is to be defined by the issued claim(s) rather thanthe description set forth herein.

Additionally, it is important to note that each term used herein refersto that which an ordinary artisan would understand such term to meanbased on the contextual use of such term herein. To the extent that themeaning of a term used herein—as understood by the ordinary artisanbased on the contextual use of such term—differs in any way from anyparticular dictionary definition of such term, it is intended that themeaning of the term as understood by the ordinary artisan shouldprevail.

Regarding applicability of 35 U.S.C. § 112, ¶6, no claim element isintended to be read in accordance with this statutory provision unlessthe explicit phrase “means for” or “stage for” is actually used in suchclaim element, whereupon this statutory provision is intended to applyin the interpretation of such claim element.

Furthermore, it is important to note that, as used herein, “a” and “an”each generally denotes “at least one,” but does not exclude a pluralityunless the contextual use dictates otherwise. When used herein to join alist of items, “or” denotes “at least one of the items,” but does notexclude a plurality of items of the list. Finally, when used herein tojoin a list of items, “and” denotes “all of the items of the list.”

The following detailed description refers to the accompanying drawings.Wherever possible, the same reference numbers are used in the drawingsand the following description to refer to the same or similar elements.While many embodiments of the disclosure may be described,modifications, adaptations, and other implementations are possible. Forexample, substitutions, additions, or modifications may be made to theelements illustrated in the drawings, and the methods described hereinmay be modified by substituting, reordering, or adding stages to thedisclosed methods. Accordingly, the following detailed description doesnot limit the disclosure. Instead, the proper scope of the disclosure isdefined by the appended claims. The present disclosure contains headers.It should be understood that these headers are used as references andare not to be construed as limiting upon the subjected matter disclosedunder the header.

The present disclosure includes many aspects and features. Moreover,while many aspects and features relate to, and are described in, thecontext of stitching along a self-guided path, embodiments of thepresent disclosure are not limited to use only in this context. Forexample, the embodiments disclosed herein may apply to, but not belimited to, cutting, gluing, welding, riveting, marking, paint,inspecting, sewing and 3D printing.

I. Overview

This overview is provided to introduce a selection of concepts in asimplified form that are further described below. This overview is notintended to identify key features or essential features of the claimedsubject matter. Nor is this overview intended to be used to limit theclaimed subject matter's scope.

Consistent with embodiments of the present disclosure, a guidingapparatus (or simply “apparatus”) 100 for use with a machine 110 for tofacilitating identifying an object and its positioning on a substrate(such as a textile, as with garments), and then performing an actionalong a self-guided path in association with that object on thesubstrate may be provided. Further, also provided is a platformconfigured to communicate with one or more of the guiding apparatus 100and the machine 110 in order to facilitate performing an action along aself-guided path. As used in the present disclosure, the term“apparatus” 100 may also be more broadly understood to include machine110 along with features and components thereof, and operations performedthereby. For example, while machine 110 may technically be responsiblefor various actions or steps as part of a sewing operation in anembodiment, it would be no less accurate to refer to the “sewingoperation performed by guiding apparatus 100.”

The disclosed guiding apparatus 100 may be, or may comprise, a sewingmachine. Alternatively or in addition, apparatus 100 may be, or maycomprise, a device or system capable of performing operations such asstitching, sewing, tacking, cutting, adhesing, bonding, welding,riveting, embossing, marking, painting, dying, drying, etching, masking,measuring, illuminating, inspecting, cutting, abrading, scoring, or 3Dprinting. Apparatus 100 may be, or may comprise, a device or systemcapable of: sewing garments; sewing patches on apparel and accessories;producing or performing operations on non-flat objects and surfaces(i.e., “3-dimensional” objects such as footwear, hats, protective gear,medical devices, electronic components, integrated circuits, etc.);producing, embedding, or performing operations on electronic devices. Asused in the present disclosure, the terms “sewing” and “sewingoperation” may also be more broadly understood to include a variety ofoperations that may be performed by guiding apparatus 100.

Apparatus 100 may include a support member 120 configured to be attachedto at least a portion of a machine 110; for example, a sewing machine.The support member 120 may be removably attached to the machine 110.Alternatively, the support member 120 may be permanently attached to themachine 110. For example, as illustrated in FIGS. 1A-B, the supportmember 120 may be in the form of a bracket that may be secured to a faceplate of a sewing machine 110 (near the end of the sewing machine withthe needle). FIG. 1A illustrates electronic components 150 of apparatus100 mounted on the support member 120. The electronic components 150 mayinclude one or more of sensors, cameras, and lighting units (depicted inFIGS. 1A-B as part of sensor system 130) user interface components andwiring, as shown in more detail in conjunction with FIGS. 5 and 32. Thelighting units (or “illumination sources”) may include one or more ofLED, incandescent, laser, and other sources, and may emit variouswavelengths on the electromagnetic spectrum, including visible spectrum,infrared, UV, radio, x-ray, or other wavelength. The sensors may includeoptical, sonic, ultrasonic, temperature, pressure, positional,rotational, atmospheric, chemical, or various other types.

The guiding apparatus 100 may further include a cover 140 for supportmember 120. For example, FIGS. 1A, 2, and 3 show different views of acover 140 placed over the support member 120. A cover 140 can provide apleasing design to the apparatus 100 and the sewing machine 110.Further, the cover 140 can provide protection to the electroniccomponents 150 of the guiding apparatus 100.

As shown in FIG. 3, the guiding apparatus 100 may also include a userinterface (“UI”) component 310. A UI component 310 may installed on oneof the support member 120 and the machine 110. The user interfacecomponent 310 may include one or more of a keyboard, a mouse, atrackpad, a touchscreen, or other user interface to provide input to theguiding apparatus 100 and/or to display one or more output parameters.

Apparatus 100 may comprise, or operate upon or within, an operationalarea 320. Operational area 320 may be, or comprise, the work area of amachine 110 such as a sewing machine. The area encompassed by anoperational area 320 may extend beyond just the immediate work surfaceor machine working area. For example, in an embodiment featuring avirtual light curtain (or “VLC”) system, the operational area 320 mayhave a monitoring boundary away from, or extending beyond, the articleupon which operations are being performed by apparatus 100. Theoperational area 320 may also be understood as the section of themachine working area in which a feature is operable, as with augmentedreality (or “AR”) systems that may illuminate and project patterns overa section—e.g., in the vicinity of sewing operations—of the machineworking area. In some embodiments (for example, where apparatus 100 is“roving” rather than stationary, operational area 320 may be moreproperly characterized as being a “field of view” of the apparatus 100or its vision or operational systems rather than a fixed, stationaryarea.

An object—such as a garment, a patch, a length of textile, a pocket, ahat, a shoe, a substrate, or a device—that is to be acted upon (e.g.,sewn, adhesed, cut, painted, scored, etc.) by apparatus 100 may bereferred to as an “operational object”. Conversely, references in thepresent disclosure to a “patch” or “patches” may also be understood toinclude various other operational objects.

Further, in some embodiments, the guiding apparatus 100 may be able tofunction in one or more of multiple available modes and sub-modes,including calibration mode(s), inspection mode(s), training mode(s), andoperation mode(s). For example, a calibration mode may include testingillumination, vision, or other sensors, capturing image or video data,visual projections, calibration stitching on a test fabric 210,comparing the calibration stitching with actual stitching, or makingcalculations for needle alignment.

An inspection mode can include an operator calibrating a machine 110,based on actually stitching a test badge to the test fabric 210. Theteaching mode can include making sure that sensors of the apparatus 100can distinguish a background fabric against the material of a patch tobe stitched onto the fabric. An operation mode can include detecting apatch overlaid on the fabric and controlling the sewing machine 110 toautomatically sew the badge onto the fabric.

In some embodiments, apparatus 100 may employ an augmented reality (AR)system to assist an operator with operation of the machine 110 (see thePV2 disclosure). An augmented reality system may, for example, projectassistive features into the workspace such as garment or patch alignmentguides, instructions, status indicators, or virtual controls. In variousembodiments, an augmented reality system can be calibrated by projectingone or more fiducial markers or patterns onto a workspace in addition oralternative to other calibration processes.

In some embodiments, apparatus 100 may comprise a “patch library” or“patch library system”, whereby the system can be trained to recognizepatches and perform appropriate sewing operations (see the PV3 and NP3disclosures). In various embodiments, a patch library may be trained onone or more patches, storing sewing parameters such as patch visualfeatures, patch contours, stitch patterns, thread parameters (thicknessetc.), and patch orientation relative to garment/substrate.

In various embodiments consistent with an apparatus 100 comprising apatch library, a library of patches and names may be used to improvequality and reduce operator mistakes, especially in the area of sewingletters on a shirt, such as in sporting apparel. The operator may enterthe name, and then place the letters on the shirt to be sewn. The visionsystem may then find the letters as normal and auto-generate the stitchpatterns, but can also verify the correct placement of the individualpatches, verify they are all present and preventing misspellings.

Currently, edge contrast is used to find outline and holes of patches,but in an alternative—for example, comprising a patch library—artwork orother graphical features inside the patch may be used to identify apre-taught patch. This can be useful when the edge of the patch issimilar in color to the background material, or the background materialis too complex to remove. The patch may be taught using a contrastingbackground to auto-detect the contours, just like in normal sewing, butthen the actual background material is placed in the machine and thepatch is found again, this time using the internal pattern of the patchto find it in the image. The location outline and holes of the patch arethen estimated from the pre-taught patch library item.

In some embodiments, guiding apparatus 100 may employ a “virtual lightcurtain” feature that can detect ingress of objects into the workspacearea (see the PV4 and NP4 disclosures). In various embodiments, guidingapparatus 100 may slow or halt sewing operation upon detecting a hand(e.g., the operator's) or an obstruction enter the workspace. In anotherembodiment, apparatus 100 may cue process stages by the entrance andexit of operator hands in the work area, For example, a stage may entailan operator loading a garment in the workspace, which loading mightitself entail placing, orienting, flattening, and securing the article.An apparatus 100 may be configured to detect these operations within thevirtual light curtain and commence further stages once hands and otherobstructions are clear of the workspace. In yet another, a virtual lightcurtain can interpret operator hand gestures as commands.

In some embodiments, apparatus 100 may have a patch tacking feature thatsews some preliminary stitches at strategic points on a patch in orderto secure it to the garment to which it is to be sewn (see the PV5 andNP5 disclosures).

In some embodiments, guiding apparatus 100 may comprise a 3-dimensionalvision system (see the PV6 and NP6 disclosures). Such a system mightinvolve, but is not limited to, for example: stereoscopic cameras, oneor more sensors (electromagnetic, acoustic, ultrasonic, etc.) that aredepth-sensitive or otherwise capable of mapping spatial morphology ofpatches, or visual processing of 3-D features via controlled motion ofitems in the workspace. In various embodiments, a 3-D vision system canaid apparatus 100 in performing operations (e.g., sewing, painting) onsubstrates having complex and/or non-flat morphology—such as a shoe, ahat, item of sports equipment, or a medical implant. Though no patch is“perfectly flat” (either in the sense of zero height deviation or in thesense of zero thickness), embodiments wherein apparatus 100 can performactions on “non-flat objects” or along “3-dimensional predeterminedpaths” may comprise the ability to accurately image (with depth)3-dimensional objects and perform actions along a plurality of spatialdirections and rotational axes.

In various embodiments consistent with an apparatus 100 comprising 3-Dvision capabilities, stereo vision may be utilized to ascertainthickness or deformation (including stretching, bunching, sagging andedge curling) of a patch, substrate, or other operational object.Non-uniformity in (or deviation from ideal of) thickness, as well asvarious deformation, can introduce errors in path placement—for example,a sewing operation may veer off course even if it's following it'spredetermined path. Some embodiments consistent with this disclosureutilize mono-vision, wherein the patch thickness and material thicknessmight be stored or manually entered as settings.

In some embodiments, apparatus 100 may include a multi-patch multi-view(“MPMV”) mode (see the PV7 and NP7 disclosures). In various embodiments,an apparatus 100 in MPMV mode may perform one or more “low-res” initialpatch finding operations, followed by one or more “high-res” patch edgefinding operations for each patch (note that relative resolution may notbe meaningfully different, in that any or all stages could be “high-res”from an image quality standpoint). An MPMV mode may improve accuracy byreducing stitch location errors related to perspective, patch height,and material thickness.

In various embodiments consistent with an apparatus 100 comprising anMPMV mode, a high-resolution process may be employed to improve accuracyand reduce errors due to patch thickness variation or material sagging.In an embodiment, after initial processing, areas sensitive to heightvariations (e.g., near the edges of the image, where perspective viewangle is large) may be flagged, and the machine 110 can automaticallymove the patch under the camera to take additional images whilepositioned directly over the previous locations that were near the edgeof the image. In addition to minimizing errors due to perspective ormaterial/patch thickness, found edges can be stitched or splicedtogether to create a more accurate stitch path.

By way of non-limiting illustrative categorization, MPMV may be seen asa subset of “variable-patch variable-view” (“VVVV”) operation, whichalso includes multi-patch single-view (“MPSV”) operation (i.e., onepatch finding operation for multiple patches) and single-patchmulti-view (“SPMV”) (i.e., multiple patch finding operations for asingle patch). In an embodiment, apparatus 100 could utilize SPMV toestimate in a first pass the locations of features on the single patch,and then make a second pass, which may include moving the camera or thepatch/substrate surface under the camera so that a more optimal view ofeach individual feature is achieved. This might help in eliminatinguncertainties in material thickness and flatness, edge curling, andother deviations from idealized operation which may lead to thegeneration of a more accurate sew path. In an embodiment, apparatus 100could utilize SPMV to aid in the accurate path generation for a singlepatch that might be too large to be imaged all at once in someembodiments. Broadly, references in the present disclosure to MPMVoperation also include other modes of VVVV operation unless otherwisestated.

In various embodiments, material sagging may be estimated to improvecalibration and projection of edges in the image into sewingcoordinates. The amount of sagging can vary with different materials andheavier patches. This information may be placed in a lookup table, andthe operator may specify what background material is being used. Thenpatch area can be estimated by the guiding apparatus to estimatesagging, and thereby improve overall accuracy.

In various embodiments, there is a multiplicity of potentialopportunities to include a stage of automatically detecting whetheroperator hands or another obstruction are in the workspace. A fewexamples include, but are not limited to: stage 1105 in FIG. 11, stage1425 in FIG. 14, and stage 1625 in FIG. 16. In embodiments consistentwith this disclosure, apparatus 100 can comprise obstruction-detectingfeatures.

Apparatus 100 may comprise a “feature avoidance system” that allows theavoidance of “non-processable features” in an operation such as sewing.Features that might get this “no-sew” treatment (n.b. any operation,including painting, cutting, etc., may get this treatment) are delicateor not-to-be-pierced features such as electrical wires, batteries,display elements (e.g., flexible OLED), or glassy materials; hardfeatures such as struts, rivets, and metallic materials, and otherundesirable locations such as adhesive points and fluid-filled areas. Inone example, a sewing operation may be directed to sew around or over(but not through) a non-processable feature.

In various embodiments, non-processable features may be pre-programmed(e.g., by a training process or by a user) into a system such as a patchlibrary system. In some embodiments not inconsistent with the aboveembodiments, apparatus 100 may have the capability (mediated by, e.g.,vision systems or other types of sensors) of detecting non-processablefeatures in real-time, in the context of an in-progress operation. In anembodiment, an object upon which operations may be performed is amedical device, which may comprise supporting structures, tissues, orwires that must be avoided so as not to harm the device. An example is aheart valve, which may contain a flexible metal structure to whichapparatus 100 sews material. In another embodiment, operations uponwearable electronics may avoid wires, displays, or other sensitivefeatures that are designated as non-processable.

Apparatus 100 may comprise a featureless patch detection system (FPDS),which may be beneficial when working with patches that don't havesufficiently visually identifying (or any) internal features, whichordinarily may aid a vision system in locating a patch.

Apparatus 100 may comprise an altered visual guidepost compensationsystem (AVGCS), which may be beneficial when working with patches thathave stretched/skewed/curled features that might otherwise throw off thevision system.

Apparatus 100 may comprise an optical uniformity disambiguation system(OUDS), which may be beneficial when working with patches whose colors,patterns, or other qualities (e.g., sheen) are insufficientlydistinguishable from the substrate to otherwise be accurately processed.

Apparatus 100 may comprise a feature transform compensation system(FTCS), which may be beneficial when working with patches and substrateswhose characteristic features (e.g., a pattern) differ in theoperational context from the “idealized” context by way of rotation,translation, reflection, or scaling.

Both the foregoing overview and the following detailed descriptionprovide examples and are explanatory only. Accordingly, the foregoingoverview and the following detailed description should not be consideredto be restrictive. Further, features or variations may be provided inaddition to those set forth herein. For example, embodiments may bedirected to various feature combinations and sub-combinations describedin the detailed description.

II. Configuration

FIG. 4 is a block diagram of an exemplary computing unit 400 In variousembodiments of guiding apparatus 100. The computing unit 400 can includea processing unit 405 comprising a processor and a memory. For example,processor 405 may be a Jetson host processor from NVIDIA®. Further, anyother computing device such as a stationary device and a mobile,handheld device may be integrated.

The processing unit 405 can connect to camera head 410 (which caninclude lighting from e.g., an LED source), a user interface device 415(such as touch panel display), a power supply 420, a control box 425 ofthe sewing machine 110, and auxiliary or “service kit” items 430 (suchas Wi-Fi/Bluetooth communication modules, USB hub, Keyboard/Trackpad andCat-5 cables).

FIG. 5 illustrates one possible operating environment through which aguiding platform 500 consistent with embodiments of the presentdisclosure may be provided. By way of non-limiting example, platform 500may be hosted on a centralized server, such as, for example, a cloudcomputing service. Alternatively, in some embodiments, platform 500 maybe implemented on one or more of the computing units of the guidingapparatus 100.

A user 505 may access platform 500 through a software application. Thesoftware application may be embodied as, for example (but not be limitedto), a website, a web application, a desktop application, and a mobileapplication compatible with a computing device 3200. Further, a user 505could control one or more operations related to guide an item along apath while performing an operation as exemplarily illustrated.

Accordingly, platform 500 may be configured to communicate with each ofthe computing unit of the guiding apparatus 100 and the sewing machine110 over communication network 510. For instance, the platform 500 maybe configured to receive control inputs from user 505 in order toinitiate a guiding session.

Accordingly, in some embodiments, the platform 500 may communicate witha software application installed on the computing unit of the apparatus100. For example, in some instances, the platform 500 may send commandsignals to the software application in order to control guidingoperations such as perform calibration, perform inspection, performteaching and perform operation.

Further, in some instances platform 500 may also be configured totransmit configuration settings to be adopted while guiding along apath. Accordingly, the computing unit of guiding apparatus 100 may beconfigured to guide along a path based on the received configurationsettings. Any of platform(s) 500, apparatus(es) 100, machine(s) 110, andcomputing device(s) 3200 may be involved in the generation,transmission, storage, processing, enactment, or supervision of sewinginstructions and other operations.

As will be detailed with reference to FIG. 32 below, the computingdevice 3200 and/or the mobile device through which the platform 500 maybe accessed may comprise, but not be limited to, for example, a desktopcomputer, laptop, a tablet, or mobile telecommunications device.

III. Operation

The disclosed guiding apparatus 100 can work in one of multipleavailable modes: 1) calibration, 2) inspection, 3) teaching, and 4)operation. During calibration mode, the system can ensure that theoptical sensors are properly aligned with the sewing needle for control.The stages involved in calibration may include: 1) illumination/sensortesting, 2) calibration stitching on a test fabric 210 (e.g., a whitesheet), 3) comparing the calibration stitching with actual stitching,and 4) making calculations for needle alignment. In this way, apparatus100 determines that the sewing machine's 110 needle is calibrated withits sensors. The calibration mode is explained in further details inconjunction with FIGS. 6-8.

FIGS. 6-24, 26, 27, and 29-31 are flowcharts setting forth generalstages involved in methods consistent with various embodiments of thepresent disclosure. Methods 600-2400, 2600, 2700, and 2900-3100 may beimplemented using a computing device 3200 as described in more detailbelow with respect to FIG. 32 below, and may be referred to as “computerimplemented methods.”

Although the methods 600-2400, 2600, 2700, and 2900-3100 have beendescribed to be performed by computing device 3200, it should beunderstood that, in some embodiments, different operations may beperformed by different networked elements in operative communicationwith computing device 3200.

Various stages in the methods 600-2400, 2600, 2700, and 2900-3100 may beperformed by at least one of a sewing machine 110, its vision systemstage, and its operator. An operator may perform stages using variousinterface elements available on one or both of the guiding apparatus 100and the sewing machine 110. In some embodiments, a sewing machine 110may have foot pedals: Left Foot Pedal (LFP) and Right Foot Pedal (RFP).

Further, one of the guiding apparatus 100 and the sewing machine 110 mayhave two keys on an operator panel: F1 key (or “Tension +” key) and F2key (or “Tension −” key). The keys Tension (+) and Tension (−) may eachhave their own respective functions when not operating in calibrationmode. However, apparatus 100 can have its own controller that interceptscommunications from the sewing machine 110 controller, enabling it tooverride the functionality of Tension (+) and Tension (−) based on thecurrent “mode” of operation. In various embodiments, a user interfacecomponent 310 or a projection from the apparatus 100 may provide anoperator with, e.g., instructions on what button to press next, whatactions to take, where to place garments and patches, error messagesrelated to placement, quality, obstructions in the workspace, etc.

Note that the calibration and other methods explained in conjunctionwith FIGS. 6-24, 26, 27, and 29-31 may be enhanced with the option ofless human interaction or replacement of human involvement or based upondesired functions presented to the lighting and optical sensor system(also known as a “VGM”) by an integrated machine/system or data compiledand analyzed within a production facility (IoT).

600. Calibration

FIG. 6 is a flowchart related to a calibration method 600 consistentwith various embodiments of the present disclosure. Calibration maybegin at stage 601. First, an operator of the sewing machine 110 mayenter calibration mode using, e.g., a user interface component 310 (suchas a touch interface system), a gesture recognition feature, a mobiledevice, etc. The guiding apparatus 100 can then enter calibration mode.In some embodiments, apparatus 100 may perform a sequence of stages,including a stage 605 of homing the machine 110 and a stage 610 ofmoving to inspection position.

Next, at stage 615, the operator may insert a calibration target—forexample, test fabric 210, which may be a white paper—and at stage 620can secure the calibration target. Note that in the context of method600 and other methods disclosed herein, stages that involve “inserting”,“placing”, “loading”, or “securing” may involve an operator or thesystem itself checking, opening, and closing clamps, or other similar orrelated processes.

In an example, FIG. 2 shows a test fabric 210 placed within thestitching area of the sewing machine. FIG. 2 shows a test fabric 210with “holes” made during an earlier test. In some embodiments, testfabric 210 can be a blank sheet with no holes. The operator may inserttest fabric 210 before entering calibration mode. The test fabric 210may also have a black backing material behind a white top. The blackbacking fabric can fill in the holes created by the needle, providinghigh contrast features for later vision calibration.

Thereafter, the operator can initiate calibration. For example, theoperator may press a button (F1 key) on the operator panel to begincalibration. The calibration mode can include two phases. Two-phasecalibration can be advantageous in various embodiments due to theprotocol of the interface between guiding apparatus 100 and the sewingmachine's 110 control board.

Accordingly, at stage 700, method 600 can enter a first phase, which isthe calibrate illumination mode shown in FIG. 7. At stage 625,calibration success is checked. If phase 1 of calibration is notsuccessful, then an operator may adjust settings at stage 630 and thenreturn to stage 700, repeating the method shown in FIG. 7. However, ifphase 1 of calibration is successful, then process may proceed to phase2 of calibration mode shown in FIG. 8. The operator may initiate phase 2by pressing a button (such as F2 key). The method 600 may then enterphase 2 calibration.

In preparation for the phase 2 calibration, in some embodiments a gridpattern may be generated at stage 635. A grid pattern can be a uniformgrid of dots that fits within the workspace, while maintaining a clearborder region around the grid and the clamping mechanism. The gridpattern's sewfile can be sent for sewing at stage 640, and the grid sewn(possibly threadlessly) at stage 645. This may involve the needle pokinga series of holes in a grid pattern (as shown in FIG. 2).

Apparatus 100 may then move to inspection position at stage 650,whereafter the second phase, which is the calibrate vision mode shown inFIG. 8, can commence at stage 800. This can involve a “Check” stage todetermine how the calibration grid pattern matches up with the expectedresults. If the phase 2 of calibration is not successful, then themethod shown in FIG. 8 may be repeated. If successful, method 600 mayconclude at stage 699. Prior to finishing, an operator may provide a“Final OK” (e.g., for safety purposes). For example, the operator maypress a foot pedal to give the final OK command.

700. Calibrate Illumination

FIG. 7 is a flowchart related to a calibration method 700 consistentwith various embodiments of the present disclosure. Method 700 cancomprise a first calibration phase of method 600. Method 700 may beginat stage 701. It can be initiated by an operator; for example, theoperator may press the F1 key to initiate phase 1. If the calibrationmode is active, then phase 1 begins. One goal of phase 1 can be tocalibrate the lighting/illumination of the guiding apparatus. This mayinclude controlling lighting units and making illumination as uniform aspossible, such that vision system sees white paper.

At stage 705, apparatus 100 can initialize defaults. At stage 710,lighting units can be synced with the frequency of ambient lighting(which may be subject to oscillations related to, e.g., the 50 Hz or 60Hz frequency of the power grid). Next, at stage 715, apparatus 100 canacquire an image of the white paper via camera of the guiding apparatus.The image parameters can then be analyzed at stage 720 to determinewhether the acquired image is acceptable (whether illumination issufficiently uniform, proper white balance, etc.). If the image isdetermined at stage 725 to have an issue—for example, insufficientlyuniformity or too dark—adjustments can be made to illumination banks atstage 730 (to improve uniformity) and to exposure and gain at stage 735(to improve brightness and white balance). Other adjustments may be madeas well. Method 700 can then return to stage 715, and further iterationsof adjustments made if necessary. In various embodiments, adjustmentsare made until certain threshold parameters are met for one or more ofexposure, gain, and intensity.

Thereafter, based on the adjustments made, the method 700 can computeoptimal values for exposure, gain, and intensity at stage 740. Thecalculated values may be received, and reported back for next command.At stage 745, the system can learn and retain non-uniform illuminationinformation—i.e., that which can't be corrected by adjustment stages730, 735, or others (if any). Method 700 may conclude at stage 799.

800. Calibrate Vision

FIG. 8 is a flowchart related to a calibration method 800 consistentwith various embodiments of the present disclosure. In some embodiments,calibration stages (calibrate illumination, calibrate vision, andpotentially other calibration stages like calibrate AR) may be performedin one phase, in a different order, or with additional or fewer stages.The method 800 can include an operator initiating the phase 2. Forexample, the operator may press the F2 key to initiate phase 2. If thecalibration mode is active, then the phase 2 may begin at stage 801.

The method 800 may include initializing image capture at stage 805 andacquiring an image of the sewn grid at stage 810 to verify Illuminationto make sure no variables were changed since phase 1 calibration. Theacquired image can be filtered at stage 815 to accentuate the holepattern. Then at stage 820 each hole and its world coordinate can beuniquely identified. In some embodiments, hole patterns may besupplemented or replaced by other pattern elements, such as ARprojections or other indicia. In such embodiments, coordinates can beidentified for these pattern elements.

Based on the image and world coordinates of the identified dots orpattern elements, the method 800 can include performing one or both ofcalibrating for distortion caused by the optics at stage 825, anddetermining the location of the camera relative to the origin of thesewing machine workspace (needle) at stage 830. Finally, visioncalibration may conclude at stage 899.

900. Sew Patch(es)

FIG. 9 is a flowchart related to a patch sewing and inspection method900 consistent with various embodiments of the present disclosure.Method 900 can include actually stitching a badge to the substratefabric. In various embodiments, an operator can determine if the machine110 was calibrated properly by seeing how the badge was stitched to thefabric.

Method 900 may begin at stage 901, entering run mode at stage 905. Anoperator can load a garment at stage 1400, according to the methodillustrated in FIG. 14. An operator or the system may then adjustsettings at stage 915, after which the system can be taught the garmentat stage 920. At stage 925 the machine can home, and then at stage 930move to an inspection position. The guiding apparatus 100 can then trainthe background of the garment at stage 1100, according to the methodillustrated in FIG. 1100. If training is determined at stage 935 to havebeen unsuccessful, method 900 can return to an earlier stage (e.g.,stage 905) to iterate on the process toward a successful backgroundtraining.

If background training was successful, the one or more patches to besewn can be placed and oriented at stage 940. At stage 1200, the visionsystem of the apparatus 100 can implement a find patches method asillustrated in FIG. 1200. The system may then show the results of stage1200 patch finding at stage 945. If, at stage 950, it is determined thatno patches were found, method 900 can return to stage 940 to place andproperly orient patches to be sewn. If there is at least one patchfound, apparatus 100 can send the sewfile to machine 110, move over theinitial stitch at stage 960, and sew the one or more patches to thegarment at stage 965. Following sewing, apparatus 100 can move intoinspection position at stage 970. Sewing can be verified at stage 1300,according to the method illustrated in FIG. 13.

If sewing does not verify, remedial stages may be taken, includingreturning to any appropriate stage or sub-process of method 900. The sewpatch(es) method 900 may conclude at stage 999.

1000. Sew Patch(es)

FIG. 10 is a flowchart related to a patch sewing and inspection method1000 consistent with various embodiments of the present disclosure.Method 1000 is similar to method 900, differing in that some stages maybe performed in a different order, and some stages may be performed inconformance with different embodiments (having e.g., a greater amount ordifferent mode of automation).

Method 1000 may begin at stage 1001 and may commence with machine homingat stage 1005 (stage 925 in method 900), followed by moving toinspection position at stage 1010 (c.f. stage 930). Next, at stage 1015,the system can enter run mode 1015, followed by garment loading at stage1400 (according to FIG. 14) and background training at stage 1100(according to FIG. 11).

Method 1000 can include an auto-find patches process at stage 1020. Thiscan be used in conjunction with a patch library (whereby the correctpatch(es) for this sewing job, and their parameters, may be stored), inembodiments comprising such a feature. In various embodiments, thisstage and others in method 1000 may be performed in conjunction with anaugmented reality projection system. For example, patches may beauto-found in a patch library and guides therefor projected onto thesubstrate to facilitate patch placement.

At stage 1025, background training can be assessed, and if furthertraining/retraining is determined necessary, an operator or the systemcan adjust settings at stage 1030 and return to stage 1100 for iterativetraining and adjustment. If no retraining is necessary, at stage 1035the patch(es) to be sewn can be placed. As with method 900, a findpatches stage 1200 can be performed, followed by results 1040, anddetermination of at least one found patch 1045 (which returns to stage1035 for placement if no patches are found). If at least one patch isfound, apparatus 100 can send the sewfile 1050 and sew the patch(es)1055.

Following sewing, at stage 1060, apparatus 100 can move into inspectionposition and verify sewing at stage 1300 (according to FIG. 13).Remedial stages may be taken if necessary, and method 1000 may concludeat stage 1099. It should be noted that methods 900 and 1000, along withsew patch methods extant in various embodiments, may return to loadadditional badges or new garments, as many times as necessary.

1100. Train Background

FIG. 11 is a flowchart related to a background training method 1100consistent with various embodiments of the present disclosure. Theteaching method 1100 can be used to make sure the sensors of the guidingapparatus 100 can distinguish the background fabric (e.g., acolor/texture/pattern) with the material of the badge to be stitched onto the fabric. Essentially, this is to ensure the optical sensors andillumination components are properly optimized for the fabric type. Oncethe guiding apparatus 100 knows the fabric type, it can better detectthe badge overlaid on the fabric and more accurately stitch the badge tothe fabric. Further, in various, the teaching stage may be performedonce for each batch of fabrics, and does not need to be performed eachtime.

Method 1100 may begin at stage 1101. At stage 1105, an operator or thesystem can determine whether an obstruction is found in the workspace,such as the operator's hands, a stray piece of fabric, or debris. If anobstruction is found, it may be removed at stage 1110 and the processstarted again at stage 1105. If no obstruction is found, at stage 1115 aset of one or more images can be captured by a camera system ofapparatus 100. The image set may cover a range of parameter values asrespects the workspace—such as exposure values, gain values, andillumination values. In various embodiments, a goal may be to cover alarge swath or the entirety of the parameter space of operatingconditions and possible illumination conditions.

At stage 1120, the image set can be analyzed to detect the presence ofe.g., high-sheen materials that may interfere with the vision system. Atthis stage, other visually problematic conditions may be detected, suchas transparency, translucency, reflectivity, or perspective-variantvisual characteristics (e.g., chromaticity). Method 1100 may conclude atstage 1199.

1200. Find Patch(es)

FIG. 12 is a flowchart related to an operation method 1200 consistentwith various embodiments of the present disclosure. The operation method1200 can include sensors detecting a badge overlaid on the fabric, andthen controlling the sewing machine to automatically sew the badge ontothe fabric. In a further, the operation method 1200 may includeproviding real-time, self-correction for correcting the position of theneedle when it gets off the desired path along a fabric.

Method 1200 may begin at stage 1201, whereupon apparatus 100 can captureimages of the workspace at stage 1205. Parameters such as exposure,illumination, and gain may be adjusted for optimal patch recognition(e.g., contrast with background material). At stage 1210 an idealbackground image can be generated, and the image can be processed forremoval at stage 1215 to remove background features (e.g., colors,patterns) from the image—again maximizing patch isolation fromextraneous background features.

Method 1200 can then at stage 1220 identify one or more patchesremaining following background removal in stage 1215. The ID'd patch(es)may then be filtered by size and shape at stage 1225 to remove unwantednoise and flaws. In various embodiments consistent with an apparatus 100having a patch library feature, ID'd patches may be matched againstknown patches in the library. At stage 1500, stitch paths may beautogenerated in accordance with the stages illustrated in FIG. 15.Stitch parameters may be applied at stage 1230. Method 1200 may concludeat stage 1299.

1300. Verify Sewing

FIG. 13 is a flowchart related to a verification method 1300 consistentwith various embodiments of the present disclosure. The method 1300 canhelp in quality checks on an on-going basis. The method 1300 may beginat stage 1301, and can next proceed to capturing image an image at stage1305. The image can be analyzed at stage 1310 to detect shift of sewnpatch(es). If patch(es) are shifted too much, then the operator may bealerted to indicate possible maintenance issues at stage 1315. Thisshifting can occur due to many factors, such as improper tacking ofpatch to background material prior to sewing, or background materialstretching or drawing up as patch(es) are sewn. Thereafter, the method1300 can include a stage 1320 checking for thread defects, such asthread breakage, and alert the operator as to any potential maintenanceissues at stage 1325. The images and analyzes performed by method 1300may be logged for customer quality system at stage 1330. Method 1300 mayconclude at stage 1399.

1400. Load Garment

FIG. 14 is a flowchart related to a garment loading method 1400consistent with various embodiments of the present disclosure. Loadingmay begin at stage 1401. At stage 1405, an operator, or apparatus 100,can determine if a clamp (or similar securing mechanism) is open orotherwise available to load a garment. If the clamp is not open, atstage 1410 the clamp can be opened, after which method 1400 returns tostage 1405.

If the clamp is open, at stage 1415 a garment can be placed and orientedin the workspace. At stage 1420 the clamp can be closed to secure thegarment. At stage 1425 an operator, or apparatus 100 (e.g., in aconfiguration employing a virtual light curtain), can determine if thereare any obstructions in the workspace that might interfere with sewingprocesses. If so, at stage 1430, any obstructions can be cleared andmethod 1400 can return to stage 1425, and may conclude at stage 1499.

Loading and unloading operations may be automated by operation offeatures of various embodiments, such as virtual light curtain, gesturerecognition, or interaction with an augmented reality system (projectedor otherwise).

1500. Autogenerate Stitch Paths

FIG. 15 is a flowchart related to a stitch path generation method 1500consistent with various embodiments of the present disclosure. Themethod 1500 may begin at stage 1501. At stage 1505, apparatus 100 canfind patch outlines (contours, edges) and any holes. At stage 1510, thesystem can determine any “false” holes that the vision systemincorrectly identified as part of the garment. One reason this mighthappen is a color match between that area of the patch and thebackground material. Other reasons might include patch surface qualities(e.g., sheen, reflectiveness, specularity) or topological complexity.Determination of false holes may be achieved in a mono-vision system.Alternatively or in addition, such a determination may be made inembodiments with 3-D, stereoscopic, MPMV, or motion-based vison aspects.

At stage 1515, smooth patch edges can be analyzed. At stage 1520, patchimage, contours, and potentially material thickness data (manually orautomatically generated) can be converted into sewing coordinatessuitable for sewing by machine 110. At stage 1525, corners and areas ofhigh curvature may be identified so that the system can take appropriatestages to sew potentially problematic areas. Method 1500 may conclude atstage 1599.

1600. Patch Tacking

FIG. 16 is a flowchart related to a patch tacking method 1600 consistentwith various embodiments of the present disclosure. In some sewingpractices, adhesive is used as a preliminary holding mechanism to securea patch for final sewing. There can be instances where the adhesive usedto hold a patch in place during sewing builds up on the needle andthread, requiring periodic cleaning by the operator to prevent threadbreakage or reduced quality stitching. As is the case throughout thepresent disclosure, the term “patch” may comprise objects of anymaterial (textiles, elastics, rubbers, polymers, metallic materials,ceramic materials, composite materials, electronic or semiconductormaterials, biocompatible materials, mixed materials, etc.), shape(polygons, rounded or curved shapes, irregular shapes, holes, cutouts,etc.), and dimensionality (flat objects, multi-layer and “raisedfeature” objects, 3-dimensional objects, etc.).

To prevent patch motion and unwanted adhesive buildup during sewing,apparatus 100 can in various embodiments perform tacking operationswherein the vision system analyses the patch, determines locations toperform a tacking operation (i.e., sew a few stitches), to hold alocation in place. Apparatus 100 may then re-image the patch to detectany motion, and perform additional tacking if necessary, repeating thesestages until enough tacking has been performed to adequately hold thepatch in place for a more durable or final continuous sewing operation.In various embodiments, a vision system of apparatus 100 can account forpatch movement between individual tacking operations as they'reperformed on a patch. Method 1600 may be used with or without anunderlayer of adhesive.

In an example, method 1600 can be used in cases where tightly coupledcommunication between the machine 110 and the vision system is notpossible, preventing real-time path adjustment during sewing. In anotherexample, method 1600 may be used in combination with other methodsdisclosed herein, including embodiments having adequate communicationbetween the machine 110 and vision system. In an embodiment, a visionsystem may comprise one or more cameras; in embodiments comprising morethan one camera, the vision system may be capable of stereoscopicvision, and such capability may help better ascertain optimal tackinglocations and patch movement or patch stretching following one or moretacking operations.

In yet another example, a tacking operation such as method 1600 may beemployed in order to mitigate (or provide additional protection against)possible stretching and movement of a badge during sewing operations.Consistent with the above examples, a tacking operation might stitch, insuccession, each of a plurality of corners of a patch, with theapparatus 100 accounting throughout for movement or stretching occurringdue to tacking stages.

In embodiments consistent with an apparatus 100 comprising a patchlibrary, method 1600 might be performed at known spots stored in thelibrary for a recognized patch. Likewise, for an unrecognized patch,method 1600 might be performed in successive imaging-tacking-reimagingstages.

1700. Calibration

FIG. 17 is a flowchart related to a calibration method 1700 consistentwith various embodiments of the present disclosure. In variousembodiments, method 1700 can be employed in the context of an augmentedreality or projection system. Such a system may be used to projectassistive features into the workspace, such as patterns, guides, systemstatus information, or virtual controls.

Many embodiments can utilize one or more calibration stages that seek toachieve optimal workspace qualities for a vision system. In addition to,in combination with, instead of, before, during, or after suchcalibration stages, apparatus 100 may perform a calibration of anaugmented reality system. In various embodiments, such a calibration canbe consistent with method 1800 as illustrated in FIG. 18. In variousembodiments, method 1700 may proceed in similar fashion to method 600 asillustrated in FIG. 6. while including the addition of one or more ARcalibration stages.

Method 1700 may be utilized in embodiments consistent with an apparatus100 having a 3-D/depth-sensing/stereoscopic vision system. For example,spatial information about the topology of items in the workspace mayinform the system about the proper calibration of augmented realityfeatures, projection coordinates, lighting parameters, etc.

1800. Calibrate AR

FIG. 18 is a flowchart related to a calibration method 1800 consistentwith various embodiments of the present disclosure. Method 1800 maybegin at stage 1801. At stage 1805, apparatus 100 can project fiducialsor other spatial indicia onto the workspace. At stage 1810, apparatus100 can capture one or more images of the workspace with projectedfiducials. Calibration can involve adjustment of individual projectionelements, and/or the qualities of one or more projected fiducials.Calibration may involve iterative stages of adjustment andimaging/observation.

From the captured imagery, the system may be able to calculatecoordinates and parameters for locations in the workspace at stage 1815.Method 1800 may conclude at stage 1899. Such spatial information may beused on its own or combined with other calibration data. In variousembodiments, AR calibration data can assist an apparatus 100 inprojecting accurate guides and other assistive information onto theworkspace.

1900. Sew Patch(es)

FIG. 19 is a flowchart related to a patch sewing and inspection method1900 consistent with various embodiments of the present disclosure. Invarious embodiments, method 1900 may proceed in similar fashion tomethod 1000 as illustrated in FIG. 10. while including the addition ofone or more augmented reality-assisted stages.

For example, method 1900 may employ a load garment stage such as method1400 as illustrated in FIG. 14. The load garment stage may be “guided”as in method 2000, as illustrated in FIG. 20. For another example,method 1900 can employ a train background stage such as, for example,method 1100 as illustrated in FIG. 11, or a method 2100 as illustratedin FIG. 21. Method 1900 may comprise a guided place patches stage suchas method 2200 as illustrated in FIG. 22.

Embodiments consistent with an apparatus 100 comprising an AR system maybe of particular benefit when operating on expensive garments orsubstrates, as the assistive features may improve the quality andconsistency of the final sewn item. Such AR systems may also lower costsand improve cycle speed due alleviating the need for certain specialtooling configurations, as well as due to waste and error. Inembodiments that comprise the ability to visually present, within theworking are of the machine 110, textual or other statusinformation/indicators to the operator, such “heads up” stylepresentation may be beneficial to operators. One reason is that theoperator may not have to look away from the workspace to view (and insome embodiments, interact with) machine 110 controls.

In an example, an AR system might project a certain symbol, color, ortextual warning to alert an operator to “keep hands clear” during asewing operation. In another example, after performing a verify sewingoperation at stage 1300 (as illustrated in FIG. 13), an AR system mayproject information about the results of the verification and mayhighlight any issues found.

Embodiments comprising AR features may also interact with other featuresof a guiding apparatus 100. For example, AR may involve or interact witha gesture recognition feature. This may be beneficial, for example, whenusing the AR projections as a “virtual keyboard” with which the operatormight interact on or about the surface of the workspace/garment.

Augmented reality systems may, in some embodiments, be achievablewith—or integral within—an extant visual system (optics, lighting,sensors, etc.) In other embodiments, AR features may necessitate one ormore additional, dedicated, or discrete components.

Projections may be monochromatic or colored, and may include featuresthat are straight, curved, irregular, text-based, temporal (e.g.,blinking), etc. Projections in various embodiments may be made withvisible light, infrared light, other electromagnetic radiation.Embodiments may comprise augmented reality features that are visible tothe naked eye. Some embodiments may comprise AR features that arevisible through an AR viewport such as a smartphone configured for VR/ARuse.

Some stages of method 1900 may be performed out of order and/orcombined. For example, a substrate loading procedure could includesimultaneous projection of garment loading guides and patch loadingguides, such that both may be loaded during the same stage (e.g., toreduce steps and save time).

2000. Guided Load Garment

FIG. 20 is a flowchart related to a garment loading method 2000consistent with various embodiments of the present disclosure. Method2000 may be utilized in various embodiments consistent with an apparatus100 comprising an AR system. Method 2000 can project assistive featuresonto a workspace in order to guide the loading of a garment (generally,an article, substrate, piece of fabric, object, etc.) in the properlocation and orientation vis-a-vis the machine's 110 workspace.

2100. Train Background

FIG. 21 is a flowchart related to a background training method 2100consistent with various embodiments of the present disclosure. Invarious embodiments, method 2100 may proceed in similar fashion tomethod 1100 as illustrated in FIG. 11. while including the addition ofone or more stages of detecting debris, blemishes, or otherobjectionable imperfections. If removable (as with a stray piece ofthread), such can be removed. If not (as with a grease stain), anoperator may load a new substrate so as to provide an accurate exemplar.

Method 2100 may be employed in a system consistent with AR, virtuallight curtain, gesture recognition, etc. to detect a stray hand or otherdebris—and possibly issue/project an “in situ” warning in the workspace.

Generally, operations like stage 2125 may be employed at various points,in various methods, in various embodiments of the present disclosure.Apparatus 100 may employ such a check, e.g., during a sewing operationprocess to prevent the waste of a patch being sewn onto a garment thatwould not end up passing quality control.

2200. Guided Place Patch(es)

FIG. 22 is a flowchart related to a patch placement method 2200consistent with various embodiments of the present disclosure. Method2200 may be utilized in various embodiments consistent with an apparatus100 comprising an AR system. Method 2200 can project assistive featuresonto a workspace in order to guide the placement of a patch in theproper location and orientation vis-a-vis the substrate.

AR assistive features can be beneficial even with the placement of arelatively simple patch objects such as a single rectangular tag or apocket. AR assistive features may be of even greater benefit whenplacing multiple and or/complex patches, such as jersey lettering.Apparatus 100 may thus provide visual guidance to an operator (or, as isgenerally possible in various embodiments, to another apparatus orautomated system) as to correct order, location, and orientation ofpatches.

2300. Train Patch Library

FIG. 23 is a flowchart related to a patch library training method 2300consistent with various embodiments of the present disclosure. Patchtraining can be utilized in embodiments comprising a patch library toteach the system visual and physical parameters, as well as desiredoptions (such as thread patterns such as “zig zag” or “straight”),regarding the patch, to be recalled in a sewing operation. Patchtraining may comprise the vision system learning internal features of apatch, outline/edge features of a patch, or both. In some embodiments,apparatus 100 may utilize both internal visual features and edgefeatures to more accurately identify and spatially locate a patch. Thismay occur in a single operation, or in a series of operations—in anexample, internal patch features may be used to get a rough location,and then edge features may be used to fine tune stitch locations.

Method 2300 may comprise modifying or adding to patch configurationinformation by a user. For example, a user may indicate for certainareas or patch features to be ignored by the vision system whendetecting and locating the patch. In other examples, a user may makemanual adjustments to stitch paths, make manual entries or adjustmentsregarding patch geometry or features (e.g., setting a patch thickness,or setting material properties for segments of a stitch path to informsewing parameters more effectively), or place non-processable featuresthat are to be avoided or stitched around.

2400. Sew Patch(es)

FIG. 24 is a flowchart related to a patch sewing and inspection method2400 consistent with various embodiments of the present disclosure. Invarious embodiments, method 2400 may proceed in similar fashion tomethod 1000 as illustrated in FIG. 10. while including the addition ofone or patch library stages. For example, method 2400 can include astage 2425 of finding one or more placed patches in a patch library thatcontains data on the found patch. Such data can contain many parametersabout the patch to be sewn, such as thread pattern, thread color,contours, height, and appearance. This data may aid in expediting patchsewing jobs that will utilize a patch repeatedly over the batch.

2600. Detect Obstruction

FIG. 26 is a flowchart related to a detection method 2600 consistentwith various embodiments of the present disclosure. Embodiments of thepresent disclosure may include a virtual light curtain feature. Such afeature may be inclusive of, or included in, a gesture recognitionsystem or a facial expression recognition system. In embodimentsconsistent with either or both of these features, it may be possible todetect the presence of a human appendage (e.g., a hand, but potentiallyincluding other natural and artificial appendages), or generally anobject, in the operational area 320 of an apparatus 100. By doing this,apparatus 100 may determine the optimal time to perform backgroundtraining and patch finding. Upon detecting an incursion into theworkspace, a VLC might act as an indicator to apparatus 100 to slow orstop and operation, or to refrain from commencing an operation.Detecting an object may be limited to detecting ingress, continuedpresence, and egress of an object, or may comprise detecting an objectthat is merely present—as an unwanted “obstruction” or “defect”, as anindicator or “beacon”, as an intended placement that nevertheless cannotbe impinged (such as a wire or strut), or otherwise—in the operationalarea 320.

Some embodiments of the present disclosure may perform backgroundtraining as soon as a garment is loaded and the clamp closed. If anobstruction such as an operator hand is in the workspace, it may throwoff training, requiring manual reentry of the training process. Inembodiments consistent with VLC features, apparatus 100 may beconfigured instead to sense the obstruction and wait to perform traininguntil the obstruction has been cleared. VLC capabilities may alsoprovide additional or alternative vehicles for automating processes invarious methods of various embodiments. For example, an indication toenter patch finding may be provided by VLC as opposed to manual input byan operator.

VLC features may, in some embodiments, be achievable with—or integralwithin—an extant visual system (optics, lighting, sensors, etc.) Inother embodiments, VLC features may necessitate one or more additional,dedicated, or discrete components.

2700. Detect Gesture

FIG. 27 is a flowchart related to a detection method 2700 consistentwith various embodiments of the present disclosure. Gesture detectioncan be a feature consistent with embodiments having VLC capabilities.Gesture recognition may allow an operator to interact with a machine 110by the use of hand motions within the workspace. In an example, avirtual button configuration may be projected onto the workspace, andgesture detection may be used (by itself, or in combination with otherfeatures such as AR or 3-D vision) to determine whether and how anoperator interacts with the virtual button space (e.g., confirming apatch recognized by apparatus 100 and selected from a patch library).

Gesture detection may, but need not, proceed as illustrated in FIG. 27by method 2700. An image capture aspect of an apparatus 100 visionsystem might be employed to detect and interpret operator gestures. Insome embodiments, gesture detection may be triggered by an indicationthat there is an object within the virtual light curtain zone.

2900. Train Background

FIG. 29 is a flowchart related to a background training method 2900consistent with various embodiments of the present disclosure. Method2900 is consistent with embodiments having depth-aware or 3-dimensionalvision systems. Such a system may use various methods to achieve z-axis(height off the workspace) spatial awareness of the working area, suchas dual (stereoscopic) or multiple cameras, electromagnetic sensors,processing of controlled motion image captures, and the like.

When sewing garments with general purpose clamping, depth variation dueto various factors, such as material sagging, multi-ply stacks, wrinklesor folds in the fabric, etc. can introduce significant uncertainty inlocating ledges in 3-D space and thus cause errors in stitch patterngeneration and compensation.

Embodiments featuring 3-D vision capabilities may ascertain paththickness, material thickness, and sagging, among other spatialproperties. Such embodiments may better accommodate the accurate sewingof patches (e.g., multi-layer or significantly protruding) and/orsubstrates (e.g., shoes or hats) that are not flat. Examples includeuneven surfaces due to multiple layers of materials that are differentshapes stacked on top of each other, or sewing on a complex curvedobject, such as a car dashboard.

Various 3-D vision embodiments may also aid in detecting tension inthread or thread stitching defects during verification. In addition totraditional stereo (2 cameras separated in distance) 3-D vision may beachieved by “depth from motion” with mono-vision hardware by instructingthe sewing machine to move the garment a known amount underneath thecamera. An example of an object 2810 that may be amenable to having apatch 2820 sewn in a 3-D vision system is illustrated in FIG. 28, whichdepicts an exemplary apparatus 100 that can comprise a 3-D visionsystem.

Method 2900 may comprise analysis of imaging information gathered by avision system to detect high-sheen materials and make adjustments basedthereon, which may involve performing an action or making an adjustmentbased on a sheen value, such as exceeding a predetermined sheen level.

3000. Sew Patch(es)

FIGS. 30A-B is a flowchart related to a patch sewing and inspectionmethod 3000 consistent with various embodiments of the presentdisclosure. Embodiments may include multi-view multi-patch (MVMP)features. In various embodiments, method 3000 may proceed in similarfashion to method 1000 as illustrated in FIG. 10. while including theaddition of one or more MVMP stages. MVMP stages can include alow(er)-res imaging stage that precedes a high(er)-res imaging stage inorder to improve accuracy. Embodiments featuring MVMP may perform asewing and inspection operation that includes an initial estimate offound patches, then move the patches (patch edges) directly under thecamera to obtain a more direct view of the edge locations, eliminatingor at least greatly reducing perspective/patch height/material thicknessinduced errors in stitch location. This mode may greatly improvesaccuracy at the cost of some cycle time since additional motion andimaging is performed prior to sewing.

3100. Verify Patch(es)

FIG. 31 is a flowchart related to a verification method 3100 consistentwith various embodiments of the present disclosure. Various methods invarious embodiments might employ a verify patches stage—two examplesinclude method 3000 as illustrated in FIGS. 30A-B, and method 2400 asillustrated in FIG. 24.

In the context of an embodiment consistent with an apparatus 100 havingpatch library features, a stage such as method 3100 might detectdeviations in a placed and imaged patch from its known-correct exemplarpatch. For example, a patch library might contain badge 2510 as depictedin FIG. 25A. However, upon imaging placed badge 2520 as depicted in FIG.25B, method 3100 can, upon detecting blemish 2530, alert the operatorthat the patch quality does not verify.

IV. Platform Architecture

The platform 500 may be embodied as, for example, but not be limited to,a website, a web application, a desktop application, and a mobileapplication compatible with a computing device. Moreover, platform 500may be hosted on a centralized server, such as, for example, a cloudcomputing service. Alternatively, platform 500 may be implemented in oneor more of the plurality of mobile devices. Although methods disclosedherein have been described to be performed by a computing device 3200,it should be understood that, in some embodiments, different operationsmay be performed by different networked elements in operativecommunication with computing device 3200. The computing device 3200 maycomprise, but not be limited to, a desktop computer, laptop, a tablet,or mobile telecommunications device.

Embodiments of the present disclosure may comprise a system having amemory storage and a processing unit. The processing unit coupled to thememory storage, wherein the processing unit is configured to perform thestages of methods disclosed herein.

FIG. 32 is a block diagram of a system including computing device 3200.Consistent with various embodiments of the present disclosure, theaforementioned memory storage and processing unit may be implemented ina computing device, such as computing device 3200 of FIG. 32. Anysuitable combination of hardware, software, or firmware may be used toimplement the memory storage and processing unit. For example, thememory storage and processing unit may be implemented with computingdevice 3200 or any of other computing devices 3218, in combination withcomputing device 3200. The aforementioned system, device, and processorsare examples and other systems, devices, and processors may comprise theaforementioned memory storage and processing unit, consistent withembodiments of the disclosure.

With reference to FIG. 32, a system consistent with various embodimentsof the present disclosure may include a computing device, such ascomputing device 3200. In a basic configuration, computing device 3200may include at least one processing unit 3202 and a system memory 3204.Depending on the configuration and type of computing device, systemmemory 3204 may comprise, but is not limited to, volatile (e.g., randomaccess memory (RAM)), non-volatile (e.g., read-only memory (ROM)), flashmemory, or any combination. System memory 3204 may include operatingsystem 3205, one or more programming modules 3206, and may include aprogram data 3207. Operating system 3205, for example, may be suitablefor controlling computing device 3200's operation. Features ofprogramming modules 3206 may include formatting and displayinginformation to the user, enabling scrolling, and formulating andtransmitting messages. Furthermore, embodiments of the disclosure may bepracticed in conjunction with a graphics library, other operatingsystems, or any other application program and is not limited to anyparticular application or system. This basic configuration isillustrated in FIG. 32 by those components within a dashed line 3208.

Computing device 3200 may have additional features or functionality. Forexample, computing device 3200 may also include additional data storagedevices (removable and/or non-removable) such as, for example, magneticdisks, optical disks, or tape. Such additional storage is illustrated inFIG. 32 by a removable storage 3209 and a non-removable storage 3210.Computer storage media may include volatile and nonvolatile, removableand non-removable media implemented in any method or technology forstorage of information, such as computer readable instructions, datastructures, program modules, or other data. System memory 3204,removable storage 3209, and non-removable storage 3210 are all computerstorage media examples (i.e., memory storage.) Computer storage mediamay include, but is not limited to, RAM, ROM, electrically erasableread-only memory (EEPROM), flash memory or other memory technology,CD-ROM, digital versatile disks (DVD) or other optical storage, magneticcassettes, magnetic tape, magnetic disk storage or other magneticstorage devices, or any other medium which can be used to storeinformation and which can be accessed by computing device 3200. Any suchcomputer storage media may be part of device 3200. Computing device 3200may also have input device(s) 3212 such as a keyboard, a mouse, a pen, asound input device, a touch input device, a camera, a sensor, etc.Output device(s) 3214 such as a display, speakers, a printer, etc. mayalso be included. The aforementioned devices are examples and others maybe used.

Computing device 3200 may also contain a communication connection 3216that may allow device 3200 to communicate with other computing devices3218, such as over a network in a distributed computing environment, forexample, an intranet or the Internet. Communication connection 3216 isone example of communication media. Communication media may typically beembodied by computer readable instructions, data structures, programmodules, or other data in a modulated data signal, such as a carrierwave or other transport mechanism, and includes any information deliverymedia. The term “modulated data signal” may describe a signal that hasone or more characteristics set or changed in such a manner as to encodeinformation in the signal. By way of example, and not limitation,communication media may include wired media such as a wired network ordirect-wired connection, and wireless media such as acoustic, radiofrequency (RF), infrared, and other wireless media. The term computerreadable media as used herein may include both storage media andcommunication media.

As stated above, a number of program modules 3206 and data files may bestored in system memory 3204, including operating system 3205. Whileexecuting on processing unit 3202, programming modules 3206 (e.g.,scrolling enablement application 3220) may perform processes including,for example, one or more of method stages as described above. Theaforementioned process is an example, and processing unit 3202 mayperform other processes. Other programming modules that may be used inaccordance with embodiments of the present disclosure may includeelectronic mail and contacts applications, word processing applications,spreadsheet applications, database applications, slide presentationapplications, drawing or computer-aided application programs, etc.

Generally, consistent with embodiments of the disclosure, programmodules may include routines, programs, components, data structures, andother types of structures that may perform particular tasks or that mayimplement particular abstract data types. Moreover, embodiments of thedisclosure may be practiced with other computer system configurations,including hand-held devices, multiprocessor systems,microprocessor-based or programmable consumer electronics,minicomputers, mainframe computers, and the like. Embodiments of thedisclosure may also be practiced in distributed computing environmentswhere tasks are performed by remote processing devices that are linkedthrough a communications network. In a distributed computingenvironment, program modules may be located in both local and remotememory storage devices.

Furthermore, embodiments of the disclosure may be practiced in anelectrical circuit comprising discrete electronic elements, packaged orintegrated electronic chips containing logic gates, a circuit utilizinga microprocessor, or on a single chip containing electronic elements ormicroprocessors. Embodiments of the disclosure may also be practicedusing other technologies capable of performing logical operations suchas, for example, AND, OR, and NOT, including but not limited tomechanical, optical, fluidic, and quantum technologies. In addition,embodiments of the disclosure may be practiced within a general-purposecomputer or in any other circuits or systems.

Embodiments of the disclosure, for example, may be implemented as acomputer process (method), a computing system, or as an article ofmanufacture, such as a computer program product or computer readablemedia. The computer program product may be a computer storage mediareadable by a computer system and encoding a computer program ofinstructions for executing a computer process. The computer programproduct may also be a propagated signal on a carrier readable by acomputing system and encoding a computer program of instructions forexecuting a computer process. Accordingly, the present disclosure may beembodied in hardware and/or in software (including firmware, residentsoftware, micro-code, etc.). In other words, embodiments of the presentdisclosure may take the form of a computer program product on acomputer-usable or computer-readable storage medium havingcomputer-usable or computer-readable program code embodied in the mediumfor use by or in connection with an instruction execution system. Acomputer-usable or computer-readable medium may be any medium that cancontain, store, communicate, propagate, or transport the program for useby or in connection with the instruction execution system, apparatus, ordevice.

The computer-usable or computer-readable medium may be, for example butnot limited to, an electronic, magnetic, optical, electromagnetic,infrared, or semiconductor system, apparatus, device, or propagationmedium. More specific computer-readable medium examples (anon-exhaustive list), the computer-readable medium may include thefollowing: an electrical connection having one or more wires, a portablecomputer diskette, a random access memory (RAM), a read-only memory(ROM), an erasable programmable read-only memory (EPROM or Flashmemory), an optical fiber, and a portable compact disc read-only memory(CD-ROM). Note that the computer-usable or computer-readable mediumcould even be paper or another suitable medium upon which the program isprinted, as the program can be electronically captured, via, forinstance, optical scanning of the paper or other medium, then compiled,interpreted, or otherwise processed in a suitable manner, if necessary,and then stored in a computer memory.

Embodiments of the present disclosure, for example, are described abovewith reference to block diagrams and/or operational illustrations ofmethods, systems, and computer program products according to embodimentsof the disclosure. The functions/acts noted in the blocks may occur outof the order as shown in any flowchart. For example, two blocks shown insuccession may in fact be executed substantially concurrently or theblocks may sometimes be executed in the reverse order, depending uponthe functionality/acts involved.

While certain embodiments of the disclosure have been described, otherembodiments may exist. Furthermore, although embodiments of the presentdisclosure have been described as being associated with data stored inmemory and other storage mediums, data can also be stored on or readfrom other types of computer-readable media, such as secondary storagedevices, like hard disks, solid state storage (e.g., USB drive), or aCD-ROM, a carrier wave from the Internet, or other forms of RAM or ROM.Further, the disclosed methods' stages may be modified in any manner,including by reordering stages and/or inserting or deleting stages,without departing from the disclosure.

Note that references throughout this disclosure to apparatus 100 shouldbe understood as incorporating, in a non-limiting manner, elements,aspects, functions, etc. of platform 500, machine 110, computing unit400, and/or computing device 3200, as needed to affect the methods andfunctions of various embodiments.

V. Claims

While the specification includes examples, the disclosure's scope isindicated by the following claims. Furthermore, while the specificationhas been described in language specific to structural features and/ormethodological acts, the claims are not limited to the features or actsdescribed above. Rather, the specific features and acts described aboveare disclosed as example for embodiments of the disclosure.

Insofar as the description above and the accompanying drawing discloseany additional subject matter that is not within the scope of the claimsbelow, the disclosures are not dedicated to the public and the right tofile one or more applications to claims such additional disclosures isreserved.

The following is claimed:
 1. A guiding apparatus comprising: anoperational area; and an augmented reality system comprising: a visionsystem, and an illumination system, wherein the augmented reality systemis configured to: project augmented reality features onto one or moreoperational objects, and identify the one or more operational objectsfor a subsequent stitching operation of the guiding apparatus along apredetermined path.
 2. The apparatus of claim 1, wherein the augmentedreality system is configured to enable a user to interact with aprojected augmented reality feature via at least one of: touch andgesture; and wherein the guiding apparatus is configured to respond toat least one of the touch and the gesture.
 3. The apparatus of claim 1,wherein the augmented reality system is configured to: identify acalibration target in the operational area, project fiducials onto thecalibration target, determine, by the vision system, image informationand spatial characteristics associated with the calibration target,calibrate the illumination system based at least one of the imageinformation and spatial characteristics, project, by the calibratedillumination system, a calibration grid pattern onto the operationalarea, sew a stitch pattern matching the calibration grid pattern, andcalibrate the vision system based at least on the stitch pattern.
 4. Theapparatus of claim 1, wherein the augmented reality system is configuredto: identify a substrate in the operational area based at least on firstaugmented reality features projected by the augmented reality system,remove from the substrate any abnormalities detected by the visionsystem, identify one or more patches at a position on the substratebased at least on second augmented reality features projected by theaugmented reality system, sew, by the guiding apparatus, the one or morepatches using a stitch pattern, and determine, by the vision system, thestitch pattern of the one or more patches matches the second augmentedreality features.
 5. The apparatus of claim 1, wherein the illuminationsystem comprises a bank of illumination sources comprising at least oneof diode sources, laser sources, electric discharge sources, andincandescent sources; and wherein the bank of illumination sources isconfigured to provide uniform illumination and uniform positionalaccuracy of the augmented reality features throughout the operationalarea.
 6. The apparatus of claim 1, wherein the apparatus is configuredto project augmented reality features onto one or more operationalobjects.
 7. The apparatus of claim 1, wherein the apparatus isconfigured to identify the one or more operational objects for asubsequent stitching operation of the guiding apparatus along apredetermined path.
 8. The apparatus of claim 1, wherein the projectedaugmented reality features comprise visual indication of non-processablefeatures.
 9. The apparatus of claim 1, wherein the vision system isconfigured to detect abnormalities in the one or more operationalobjects; and wherein the projected augmented reality features comprisevisual indication of detected abnormalities.
 10. A method forcalibrating an augmented reality system coupled with a guidingapparatus, the method comprising: identifying a calibration target in anoperational area of the guiding apparatus; projecting fiducials onto thecalibration target; determining image information and spatialcharacteristics associated with the calibration target; performing afirst calibration process based at least one of the image informationand spatial characteristics; projecting a calibration grid pattern ontothe operational area; sewing a stitch pattern matching the calibrationgrid pattern; and performing a second calibration process based at leaston the stitch pattern.
 11. The method of claim 10, further comprising:projecting augmented reality features onto one or more operationalobjects.
 12. The method of claim 11, further comprising: identifying theone or more operational objects for a subsequent stitching operation ofthe guiding apparatus along a predetermined path.
 13. The method ofclaim 10, wherein the projected augmented reality features comprisevirtual user interface elements projected into the operational area. 14.The method of claim 13, further comprising receiving a user tointeraction with a projected augmented reality feature via at least oneof: touch and gesture.
 15. The method of claim 14, further comprising:responding to at least one of the touch and the gesture.
 16. The methodof claim 11, wherein the projected augmented reality features comprisevisual indication of non-processable features.
 17. The method of claim10, further comprising: detect abnormalities in the one or moreoperational objects.
 18. The method of claim 17, wherein the projectedaugmented reality features comprise visual indication of detectedabnormalities.
 19. A method for operating an augmented reality systemcoupled with a guiding apparatus, the method comprising: identifying asubstrate in an operational area of the guiding apparatus based at leaston a first set of projected augmented reality features; identifying oneor more patches at a position on the substrate based at least on asecond set of projected augmented reality features; sewing the one ormore patches using a stitch pattern; and determining the stitch patternof the one or more patches matches the second set of augmented realityfeatures.
 20. The method of claim 19, further comprising: projectingvirtual user interface elements projected into the operational area;receiving a user to interaction with a projected augmented realityfeature via at least one of: touch and gesture; and responding to atleast one of the touch and the gesture.